Ifilimu yokulwa nokukhanya ye-AR eboshwe nge-silicon lens monocrystalline silicon eyenziwe ngokwezifiso
Izici ze-silicon lens ezimboziwe:
1. Ukusebenza kwe-Optical:
Ibanga lokudlulisa: 1.2-7μm (eduze kwe-infrared kuya kwe-mid-infrared), ukudlulisa >90% kubhendi yefasitela elisemoyeni elingu-3-5μm (ngemuva kokumbozwa).
Ngenxa yenkomba ephezulu yokugqama (n≈ 3.4@4μm), ifilimu evimbela ukubonakaliswa (njenge-MgF₂/Y₂O₃) kufanele ifakwe ipulasitiki ukuze kuncishiswe ukulahleka kokubonakaliswa kobuso.
2. Ukuqina kokushisa:
I-coefficient yokwandisa ukushisa ephansi (2.6×10⁻⁶/K), ukumelana nokushisa okuphezulu (izinga lokushisa lokusebenza kufika ku-500℃), ifanele ukusetshenziswa kwe-laser enamandla aphezulu.
3. Izakhiwo zemishini:
Ubulukhuni be-Mohs 7, ukumelana nokuklwebheka, kodwa ukuphuka okuphezulu, kudinga ukuvikelwa kokugoba okunqenqemeni.
4. Izici zokumboza:
Customized anti-reflection film (AR@3-5μm), high reflection film (HR@10.6μm for CO₂ laser), bandpass filter film, etc.
Izicelo ze-silicon lens ezimboziwe:
(1) Uhlelo lokuthwebula izithombe zokushisa olusebenzisa i-infrared
Njengengxenye eyinhloko yamalensi e-infrared (ibhendi engu-3-5μm noma engu-8-12μm) yokuqapha ukuphepha, ukuhlolwa kwezimboni kanye nemishini yokubona ebusuku yezempi.
(2) Uhlelo lwe-laser optical
I-CO₂ Laser (10.6μm): Ilensi yokubonisa ephezulu yama-resonator e-laser noma isiteringi se-beam.
I-laser yefayibha (1.5-2μm): Ilensi yefilimu elwa nokukhanya ithuthukisa ukusebenza kahle kokuxhuma.
(3) Imishini yokuhlola i-semiconductor
Inhloso ye-infrared microscopic yokuthola amaphutha e-wafer, ukumelana nokugqwala kwe-plasma (kudingeka isivikelo esikhethekile sokumboza).
(4) amathuluzi okuhlaziya ama-spectral
Njengengxenye ye-spectral ye-Fourier infrared spectrometer (FTIR), kudingeka ukudlulisa okuphezulu kanye nokuphambuka okuphansi kwe-wavefront.
Amapharamitha obuchwepheshe:
Ilensi ye-silicon e-monocrystalline embozwe nge-coated isibe yingxenye ebalulekile engenakuphindwa ohlelweni lwe-infrared optical ngenxa yokudlulisa kwayo ukukhanya okuhle kwe-infrared, ukuzinza okuphezulu kokushisa kanye nezici zokugqoka ezingenziwa ngokwezifiso. Izinsizakalo zethu ezikhethekile ezenziwe ngokwezifiso ziqinisekisa ukusebenza okuhle kakhulu kwamalensi ezinhlelweni ze-laser, zokuhlola kanye nezokuthwebula izithombe.
| Okujwayelekile | Intengo Ephakeme | |
| Izinto | I-Silicon | |
| Usayizi | 5mm-300mm | 5mm-300mm |
| Ukubekezelela Usayizi | ± 0.1mm | ± 0.02mm |
| Imbobo Ecacile | ≥90% | 95% |
| Ikhwalithi Yomphezulu | 60/40 | 20/10 |
| Isikhungo | 3' | 1' |
| Ukubekezelela Ubude Be-Focal | ±2% | ±0.5% |
| Ukugqoka | Okungagqokwanga, i-AR, i-BBAR, okubonakalisayo | |
Isevisi yangokwezifiso ye-XKH
I-XKH inikeza ukwenza ngokwezifiso okugcwele kwenqubo yamalensi e-silicon e-monocrystalline ambozwe nge-coated: Kusukela ekukhetheni i-substrate ye-silicon e-monocrystalline (ukumelana >1000Ω·cm), ukucubungula okuqondile kwe-optical (okuyindilinga/okuyi-aspherical, ukunemba kobuso λ/4@633nm), ukugqoka okwenziwe ngokwezifiso (ifilimu yokulwa nokukhanya/ukukhanya okuphezulu/ukuhlunga, ukusekela ukwakheka kwamabhendi amaningi), kuya ekuhlolweni okuqinile (isilinganiso sokudlulisa, umkhawulo womonakalo we-laser, ukuhlolwa kokuthembeka kwemvelo), ukusekela i-batch encane (izingcezu eziyi-10) kuya ekukhiqizweni okukhulu. Iphinde inikeze imibhalo yobuchwepheshe (ama-coating curves, amapharamitha okukhanya) kanye nokusekelwa kwangemva kokuthengisa ukuze kuhlangatshezwane nezidingo ezidingekayo zezinhlelo zokukhanya ze-infrared.





